| ID | 原文 | 译文 |
| 42196 | 在集成 NV 色心量子传感器研制过程中发现，微波场驱动 NV 色心能级间的电子跃迁，对光探测磁共振、拉比振荡、拉姆齐序列、自旋回波、退相干时间等参数均有影响，从而进一步影响到传感器的灵敏度。 | During the development of the integrated NV color center quantum sensor, it isdiscovered that the microwave field drives the electronic transition between the NV color center energylevels, which has an impact on the optical detection magnetic resonance, Ｒabi oscillation, Ｒamsey sequence, spin echo, decoherence time and other parameters, thereby further affecting the sensitivity of thesensor. |
| 42197 | 因此设计能产生均匀磁场且转化效率高的微纳工艺近场天线对提高集成 NV 色心传感器的性能极其重要。 | So the design of a micro-nano process near-field antenna which can generate a uniform magneticfield and has high conversion efficiency is extremely important to improve the performance of the integrated NV color center sensor. |
| 42198 | 重点阐述了 NV 色心自旋调控天线原理及工艺特点，对现有的多种天线做了介绍，并对基于 CMOS 工艺的集成化微波芯片做了重点介绍; | This article focuses on the principle and process characteristics of the NVcolor center spin-control antenna, introduces various antennas in the present, especially the integratedmicrowave chip based on CMOS process. |
| 42199 | 从天线结构、性能等方面对微带线、共面波导、微纳天线等进行了分析; | Antennas with the structure of microstrip lines, coplanarwaveguides, and micro-nano are analyzed from the aspects of structure and performance. |
| 42200 | 结合微波天线的发展趋势，对芯片级固态量子传感器进行了介绍。 | Chip-level solidstate quantum sensors are introduced combined with the development trend of microwave antennas. |
| 42201 | 按照 JEDEC 标准对一种含空腔的塑封微摄像头器件进行了吸湿试验和回流焊。 | The moisture absorption test and the following reflows were performed for the cavity-containing plastic encapsulated micro-camera device according to JEDEC standards. |
| 42202 | 分析了器件的失效模式，采用有限元法进行湿扩散、热传导和湿热应力模拟。 | The failure modes of thetested device were analyzed.Meanwhile, the moisture diffusion, heat conduction and hygrothermal stresswere simulated by finite element method. |
| 42203 | 模拟结果显示，器件空腔内压力达到饱和蒸气压且与湿热应力共同作用时，器件内部应力明显增大，空腔四周界面高应力区域位置与器件实际失效位置一致。 | The simulation results demonstrate that as the saturated vaporpressure in the cavity reaches the upper limit and interacts with the hygrothermal stress, the stress in thedevice increases significantly, and locations of high stress regions are in consistent with the device failurelocations in the experiments. |
| 42204 | 器件吸湿对有空腔的塑封微摄像头器件在回流焊过程中的失效有显著的影响，器件空腔内的水蒸发产生的压力增加了界面出现分层的可能性。 | The moisture absorption has a significant effect on the failure of the cavitycontaining plastic encapsulated micro-camera device during reflows, and the pressure generated by theevaporation of water inside the cavity increases the possibility of the interfacial delamination. |
| 42205 | 以塑封微摄像头器件中吸湿材料的饱和状态为控制关键因素，在器件空腔内表面湿气达到饱和状态下，结合理想气体公式设计空腔体积，避免过小空腔体积导致的高蒸气压力， | Taking the saturation status of moisture-absorbing materials in the plastic encapsulated micro-camera device as thekey control factor, the cavity volume can be designed according to the ideal gas law under the saturatedstatus of moisture on the inner surfaces of the device cavity, thus to avoid the high vapor pressure due tothe small cavity volume. |