ID | 原文 | 译文 |
23405 | 然后通过Tsallis灰度熵的最大化阈值分割方法自动分离目标和背景,获得二值图像。 | Then, in order to separate the targets and the background and generate binary images automatically, a threshold segmentation algorithm, called maximizing the Tsallis entropy, is applied. |
23406 | 最后,对相邻多帧图像背景建模并差分,再结合三帧间差分法提取动目标阴影,结果标记至原帧图像相应位置。 | Finally, shadow detection is accomplished by the background difference with three frame difference method, and the detection results are marked on the corresponding position in the original frame. |
23407 | 基于美国Sandia实验室公布的VideoSAR成像片段,实现了多个移动车辆的检测,验证了所提算法的有效性。 | Experimental results utilizing the VideoSAR imaging fragment published by Sandia National Laboratories show that multiple moving vehicles are detected effectively, hence the validity of the approach is demonstrated. |
23408 | 该文提出了一种基于内建自测试(BIST)的 Test-Per-Clock 混合模式向量产生方法。 | A mixed-mode Test-Per-Clock Built In Self Test (BIST) scheme is proposed. |
23409 | 测试由两个部分组成:自由线性反馈移位寄存器(LFSR)伪随机测试模式和受控 LFSR 确定型测试模式。 | The test consists of two parts: the free Linear Feedback Shift Register (LFSR) pseudo-random test mode and the deterministic test pattern based on controlled LFSR. |
23410 | 伪随机测试模式用于快速地检测伪随机易测故障,减少确定型数据存储。 | Pseudo random test mode is used to quickly detect pseudo-random susceptible faults and reduce the deterministic data storage. |
23411 | 受控 LFSR 测试模式采用直接存储在 ROM 中的控制位流对剩余故障产生确定型测试。 | Controlled LFSR test mode uses the control bits directly stored in the ROM to generate a deterministic test of the remaining faults. |
23412 | 通过对提出的 BIST 混合模式测试结构理论分析,提出了伪随机向量的选取方法以及基于受控线性移位确定型测试生成方法。 | Based on the theoretical analysis of the proposed mixed-mode BIST test structure, a pseudo-random test sequence selection method and a deterministic test generation method based on controlled linear shifter are proposed. |
23413 | 基准电路的仿真结果表明,该方法可以获得完全单固定型故障覆盖率,其测试产生器设计简单且具有良好的稳定性,与其他方法相比,具有较低的测试开销和较短的测试应用时间。 | Simulation results on benchmark circuits show that the proposed method can obtain the complete single stuck-at fault coverage and has good stability in test generation. Compared with other methods, it has simpler Test Pattern Generator (TPG) design and lower test cost as well as shorter test application time. |
23414 | 合成孔径雷达高度计的关键技术特点是沿轨向的多普勒锐化和延迟距离校正技术。 | The key invoation technology of Synthetic Aperture Radar ALtimeter (SARAL) are Doppler-beam sharppen and delay/doppler range compensation. |