ID 原文 译文
53367 在老化的不同时期，针对老化程度，动态调节延迟单元的延迟大小，得到不同的保护带宽度，从而提高老化预测的准确率。 In order to improve the detection rate, delay of the delay element that finally forms the guard band interval can be adjusted for different degrees of severity in the aging process.
53368 并通过反馈电路达到对稳定性校验器的输出进行锁存的目的。 Moreover, feedback circuit in the proposed design can complete latch function perfectly.
53369 与经典结构相比，电路在面积上平均节省 20. 6%左右，在功耗方面减少 36%左右。 The overhead is significantly small by comparing with the classical structure. Itreduces the area by about 20. 6% on the average and reduces the power by about 36%.
53370 Spice 模拟器的仿真结果证实了电路的优越性。 Results from the Spice simulation illustrate the superiority of this work.
53371 随着纳米工艺的不断发展，可靠性成为集成电路设计中主要的挑战，特别是像航空，航天和军事等高科技领域。 Along with the advance of nanometer technology, reliability has become the most important challenge in IC design, especially in some special fields, such as aviation, aerospace and the military.
53372 在深亚微米工艺中，老化效应和软错误是影响电路可靠性的重大因素，业界虽已对此做过研究， In ultra-deep submicron technology, aging effect and soft errors are the key factors to affect the circuit reliability. Countermeasures to avoid the reliability problem have been studied for many years.
53373 但是大部分都是把它们分开处理，它们中的大多数结构工作时都存在一个或多个点处于浮空态，存在严重的电荷衰减问题，尤其易受干扰，大大影响了检测结果的准确性。 However, most are taken separately, furthermore, a lot of them have the problem existing one or more floated node in some special time window, degrading the accuracy of the detection .
53374 本文提出一种新的机制，采用一种低功耗的多功能稳定性检测器来同时解决老化，软错误和延迟故障， In this paper, a new mechanism is proposed, with a low power stability checker which can not only detect delay fault and soft errors, but also predict aging effect.
53375 特别是它彻底解决了浮空点问题。 Especially the checker completely solves the floated nodes problem.
53376 利用 Hspice 仿真工具得到的实验结果表明该结构具有良好的性能和面积权衡，其功耗开销比参照结构节约超过 35%。 Experiments using Hspice show that the structure proposed in this paper can achieve a good performance–areas tradeoff and save more than 35% power consumption compared with the original one.