ID 原文 译文
52427 使得偏置电压在尽量长时间内处于最佳偏置点附近，且在最佳偏置点附近游走的范围尽量小。 Therefore, the bias voltage can always stay at the best bias point with small the range of variation.
52428 通过实验分析了影响算法结果的因素。 The factors that affect the results of the algorithm are analyzed in the experiment verification.
52429 实测数据表明，此算法能在较短时间内找到双平行马赫-曾德尔调制器最佳工作偏置点，并能实时进行跟踪调整。 The measured data show that this algorithm can find the best working bias point of dual parallel Mach-Zehnder modulator in a relatively fast time. It also shows the ability to track and adjust the working bias point in real time.
52430 介电常数是表征材料介电特性的物理量， The dielectric constant is a physical quantity that characterizes the dielectric properties of a material.
52431 随着微波电介质在航空器、船舶及车辆和通信等领域的广泛应用，介电常数的精确测量成为人们研究的一个重要内容。 With the use of microwave dielectrics in aircraft, ships, vehicles, communications, and other fields, the accurate measurement of dielectric constant has become a hot research topic.
52432 为了提高介电常数的测量精度，文章首先提出一种加载六边形互补开口谐振环 (CSRR) 的微波无损平面传感器。 In order to improve the measurement accuracy of dielectric constant, a microwave non-destructive planar sensor loaded with hexagonal Complementary Split Ring Resonator (CSRR) is proposed.
52433 将六边形CSRR微带谐振器与传统的四边形CSRR微带谐振器进行对比，分析结果表明，六边形CSRR较四边形CSRR微带谐振器具有较高的灵敏度，且品质因数也有一定的提高。 Comparing with the traditional quadrilateral CSRR microstrip resonator, the analysis results show that the hexagonal CSRR microstrip resonator has higher sensitivity than the quadrilateral CSRR, and the quality factor is also improved.
52434 然后，研究了六边形CSRR微带谐振器谐振频率的变化与介电常数的相互作用规律， Then, the interaction of the resonant frequency and the dielectric constant of the hexagonal CSRR microstrip resonator is studied.
52435 仿真结果表明，当待测样品的介电常数变大时，其谐振频率变小，且谐振频率的负二次方与介电常数呈线性关系; The simulation results show that when the dielectric constant of the measured sample becomes larger, the resonant frequency becomes smaller. The negative quadratic and the dielectric constant are linearly related.
52436 将仿真数据进行数据拟合得到介电常数与谐振频率之间的解析式，验证了通过测量加载待测样品时传感器的谐振频率实现对待测样品介电常数测量的可能性， The analytical data of the dielectric constant and the resonant frequency are obtained by fitting the data of the simulation data, which are verified by measuring the resonant frequency of the sample when loading the measured sample.