ID 原文 译文
43856 平面 LED 光源采用标准层压工艺封装, The plane LED light source was packaged by a standard laminated packaging process.
43857 对封装后的 LED 模组进行高温高湿耐候试验与水下环境试验,并与未封装的 LED 模组进行对比实验。 High temperature and high humidity weathering test andunderwater environment experiment were carried out on the encapsulated and unencapsulated LEDmodules, respectively.
43858 实验结果表明,在环境温度为 80 ℃、相对湿度为 80%,模组工作电流为 300 mA,连续 33 天高温高湿条件下,层压封装的平面 LED 模组的照度变化和温度均高于未封装的 LED 模组。 The test results show that compared with the unpackaged LED modules, the variation of illuminance of the laminated plane LED modules are larger and the temperature are higher afterworking at ambient temperature of 80 and relative humidity of 80% under a current of 330 mA for33 days continuously.
43859 40 ℃水下环境下连续工作 400 h,层压封装的平面 LED 模组的照度略有变化,且光衰小于 1%。 After continuous operation for 400 h in 40 underwater environment, the illuminance of the laminated plane LED modules change slightly, and the light decay is less than 1%.
43860 因此,层压封装能有效阻断外界高温高湿环境对 LED 模组可靠性的影响,更适合在常温水下照明应用。 Therefore, the laminated package can effectively block the influences of the high temperature and highhumidity environment on the reliability of the LED modules, and is more suitable for the underwater lighting application at room temperature.
43861 研制了一套用于片上皮法级电容测试系统的电容标准件,量值低至 1 pF,频率达到1 MHz。该电容标准件采用 GaAs 衬底,金属-绝缘层-金属 ( MIM) 结构的电容器阵列实现,其标称值分别为 1,10 100 pF。 A set of capacitance standards which has a nominal capacitance value as low as 1 pF andthe operating frequency up to 1 MHz were developed for on-chip pF-capacitance test system was realizedusing an array of the metal-insulator-metal (MIM) capacitors on GaAs substrate, and the nominal valuesare 1, 10 and 100 pF, respectively.
43862 为了消除由探针系统和外界环境引入的分布电容的影响,在芯片同一单元内设计了在片开路器,电容测量准确度达到±1%。 In order to compensate the influences of the stray capacitance introduced by the probe system and outer environment, an on-chip open was designed in the same cell on thechip, and the accuracy of the capacitance measurement reached to ±1%.
43863 建立了在片皮法级电容测量模型,利用组建的可溯源在片定标装置对电容样片定标后,进行重复性和稳定性考核,最终研制出年稳定性小于 0. 4%的电容标准件一套。 An on-chip pF-capacitance measurement model was built, and the capacitance samples were calibrated by using the established on-chipcalibration equipment.After assessing the repeatability and stability, a set of capacitance standards were finally produced with the annual stability of 0.4%.
43864 测量结果及标准件应用表明,研制的标准件可为片上皮法级电容测试系统进行现场整体校准。 Measurement results and standards application shows thatthe standards can be used for the overall on-site calibration by the on-chip pF-capacitance test system.
43865 射频/微波能量收集系统以可持续、环保等优点在无线传感器网络、可穿戴设备等领域具有广泛应用前景。 The RF /microwave energy harvesting system has broad application prospects in the fieldsof wireless sensor networks and wearable devices due to the advantages of sustainable development andenvironmental protection.