ID 原文 译文
43466 测试结果表明，在 500 MHz 采样速率、100 MHz 输入信号频率下，测得该 DAC 的 SFDＲ 和三阶互调失真分别约为 76 和 78 dB，动态性能得到明显提升。 The test result shows that at 500 MHz sample rate and 100 MHz input signal frequency the SFDＲ and third-order inter-modulation distortion of the DAC are about 76 and 78 dB, respectively.The dynamic performance of the DAC is significantly improved.
43467 针对工业界高速串行接口 ( SerDes) 发射级的驱动器在电离干扰条件下受到单粒子效应 ( SEE) 干扰导致传输出错的问题，分析了经典高速 SerDes 驱动器结构受 SEE 干扰的机理， Aiming at the problem that the industrial high speed serial interface (SerDes) driver issubjected to single event effects (SEEs) interference induced transmission error under ionization interference conditions, the mechanism of the SEEs interference of the classical high speed SerDes driver structure was analyzed.
43468 提出了一种采用密勒补偿的互补电流源全差分驱动电路结构，能够显著抑制单粒子效应在驱动器敏感节点上引起的扰动，改善高速 SerDes 抗 SEE 干扰的能力。 A complementary current source fully differential driving circuit structure with Miller compensation was presented, which can significantly suppress the SEEs induced interference at the driver'ssensitive nodes and hence improve the immunity to the SEEs interference of the high speed SerDes.
43469 基于所提出的驱动器结构设计了一款 3. 125 Gbit /s 的高速 SerDes 收发器，并在 130 nm 部分耗尽型 ( PD) 绝缘体上硅 ( SOI)CMOS 工艺下完成了流片。 On the basis of the proposed driver structure, a 3.125 Gbit /s high speed SerDes transceiver was designed and fabricated in 130 nm partially depleted (PD) silicon on insulator (SOI) CMOS process.
43470 在 SEE 的干扰条件下的测试结果显示，该驱动器的单粒子瞬态能量阈值显著高于经典结构驱动器，达到 21. 9 MeV·cm2·mg－1，可应用于星载计算机高速数据传输。 The test results under SEEs interference conditions show that the single event transient energy threshold of the driver is significantly higher than that of the driver with classical structure, reaching 21.9 MeV·cm2·mg－1, which canbe applied to onboard computer high speed data transmission.
43471 大信号测试系统是评估 GaN 功率器件的非线性特性的重要手段，而精准的矢量校准是获得稳定可信测试数据的第一步。 The large-signal measurement system is an important method for evaluating the nonlinearperformance of GaN power devices, and accurate vector calibration is the first step in obtaining stable andreliable test data.
43472 为了解决毫米波频段矢量校准易随时间增加而失效的难题，对不同的校准方法进行了讨论， In order to solve the issue that vector calibration is easy to lose effectiveness with timeat millimeter wave band, different calibration methods were discussed.
43473 并以直通－反射－匹配负载 ( TＲM) 校准方法为基础，对校准过程中的误差系数随时间变化的趋势进行了数据分析，提出了一种可以实时快速修正校准模型中误差系数的方法。 Based on the thru-reflect-match(TＲM) calibration method, the data analysis of the variation trend of error coefficients with time in thecalibration process was carried out, and a method for quickly correcting the drift error coefficients in thecalibration model was proposed.
43474 采用这种方法，失效的校准状态可以在 1 min 内得到快速修正而恢复初始校准状态; With this method, the failed calibration state can be quickly correctedwithin 1 min to return to the initial calibration state.
43475 矢量校准的时间稳定度与传统方法相比，可延长 10 倍以上。 Therefore, the time stability of vector calibration canbe extended by more than 10 times compared with the traditional method.