ID 原文 译文
43266 在刻蚀电压为 23 V 及以上电压时牺牲层被完全去除; When the etching voltage is 23 V and above, the sacrificial layer is completely removed.
43267 刻蚀过程中刻蚀速率逐渐降低，100 μm 的纳米薄膜可在 270 s 时制作完成。 During the etch process, the etch rate is gradually reduced, and the100 μm nanomembranes can be fully etched out at 270 s.
43268 由于Ⅲ族氮化物材料自身的物理特性，InGaN /GaN 量子阱结构存在极化效应导致能带倾斜，极大地影响了 LED 的辐射复合效率。 Due to the physical properties of the Ⅲ-nitride material, the polarization effect of theInGaN /GaN quantum well structure leads to energy band tilting, which greatly affects the radiation recombination efficiency of the LED.
43269 采用阶梯状量子阱的结构来改善 LED 的发光特性，通过金属有机物化学气相沉积 ( MOCVD) 系统在 4 英寸 ( 1 英寸 = 2. 54 cm) 蓝宝石衬底上外延生长了 3 种不同量子阱结构的样品，并对其进行材料结构与器件性能的表征。 The structure of the step-like quantum well was used to improve theluminescence characteristics of LED.Three samples with different quantum well structures wereepitaxially grown on a 4 inch (1 inch = 2.54 cm) sapphire substrate by metal organic chemical vapourdeposition (MOCVD) system, and the material structure and device properties were characterized.
43270 实验结果表明，In 组分减小的阶梯状量子阱样品相对于传统量子阱结构，其在电致发光 ( EL) 谱中蓝移现象几乎消失; The experimental results show that compared with the conventional quantum well structure, the blue shift phenomenon of electroluminescence (EL) spectrum of the sample with the stepped quantum well of decreasing In composition is almost disappeared.
43271 同时在注入电流为 140 mA 时，其发光功率以及外量子效率分别提高 3. 8% 和5. 1%。 Meanwhile, when the injection current is 140 mA, the luminous power and external quantum efficiency increase by 3.8% and 5.1%, respectively.
43272 此外，Silvaco Atlas 软件的仿真结果显示了该样品的量子阱中具有更高的空穴浓度与辐射复合效率。 In addition, thesimulation results of Silvaco Atlas software also show that the sample has a higher hole concentration andradiation recombination efficiency in the quantum well.
43273 宽带微波微系统是由系列化、标准化封装的微波功能模块构成的复杂微波组件。 Wideband microwave microsystem is a complex microwave component, which is constituted by microwave function modules using serialized and standardized integration technology of package.
43274 针对组件测试指标多的需求，设计了具有一键化测试、数据可重构、参数可配置、数据自动采集、结果自动存储等多项功能的宽带微波微系统自动测试系统。 In order to meet the requirements of component test indexes, the automatic results test system for wideband microwave microsystem was designed, and it had the functions of one-key test, reconfigurable data, parameters configurable, automatic data acquisition and automatic results storage, etc.
43275 首先阐述了自动测试系统的调试功能、校准功能、检测功能等; Firstly, the debugfunction, calibration function and detection function of the automatic test system were introduced.