ID |
原文 |
译文 |
41516 |
测试结果表明,人体模型 ( HBM) ESD 防护能力可达 4 kV,泄漏电流为 25. 45 nA。 |
The test results show that the ESD protection abilityof the human body model (HBM) can reach 4 kV and the leakage current is 25.45 nA. |
41517 |
设计并流片实现了一款具有寄生电阻消除功能的远端测温芯片。 |
A remote temperature measurement chip with parasitic resistance cancellation functionwas designed and implemented. |
41518 |
分析了远端测温原理和寄生电阻对测温精度的影响, |
The principle of remote temperature measurement and the influence ofparasitic resistance on the temperature measurement accuracy were analyzed. |
41519 |
利用差分结构采集远端三极管产生的温度信号。 |
The differential structure was used to collect the temperature signal generated by the remote transistor. |
41520 |
采用一阶 Σ-Δ模数转换器 ( ADC) 将温度信号进行量化, |
The first-order Σ-Δ analogto-digital converter (ADC) was used to quantify the temperature signal. |
41521 |
并使用寄生电阻消除技术降低寄生电阻对测温精度的影响。 |
Meanwhile the parasitic resistance cancellation technology was used to reduce the influence of parasitic resistance on the temperaturemeasurement accuracy. |
41522 |
该芯片采用 0. 18 μm BCD 工艺设计并流片, |
The chip was designed and fabricated by 0.18 μm BCD process. |
41523 |
测试结果表明,当远端三极管在-40 ℃ 下,使用寄生电阻消除技术可以将 1. 5 kΩ 寄生电阻对测温精度的影响降低到 0. 5 ℃ 以内; |
The measurement results show that when the remote transistor is at -40 ℃, the influence of 1.5 kΩ parasitic resistance on the temperature measurement accuracy is reduced to less than 0.5 ℃ using the parasitic resistance cancellation technology. |
41524 |
远端三极管在-40~125 ℃温度范围内,消除寄生电阻影响后远端测温芯片的 3σ 误差小于±0. 6 ℃。 |
When the remote transistor is at the temperature range of -40-125 ℃, the 3σ error of the remote temperature measurement chip is less than ± 0.6 ℃ after cancelling theinfluence of parasitic resistance. |
41525 |
基于推推振荡器结构设计了一种低相位噪声的毫米波压控振荡器, |
A millimeter wave voltage controlled oscillator (VCO) with low phase noise was designedbased on the structure of the push-push oscillator. |