ID 原文 译文
41116 最后，指出了SiC及其功率器件激光制孔面临的挑战，并展望了未来的发展方向。 Finally, the challenges of laser drilling of SiC and its power devices are pointed out, and the future development directions are prospected.
41117 采用基于硝酸/氢氟酸/磷酸/硫酸混合液的湿法腐蚀工艺，实现了高吸收效率的黑硅结构的制备与工艺集成，获得了具有近红外响应增强效果的黑硅PIN光电探测器， The nearly infrared enhanced PIN photodetector with high absorption efficiency black silicon micro-structure was fabricated by wet etching process based on nitric acid/hydrofluoric acid/phosphoric acid/sulfuric acid mixture.
41118 并与未集成黑硅的PIN光电探测器的性能参数进行了对比测试。 And the parameters of the fabricated photodetector were tested and compared with that of the PIN photodetector without black silicon.
41119 测试结果显示，黑硅光电探测器在1 060nm波长下的响应度达到0.69A/W(量子效率80.7%)，较未集成黑硅的器件提高了116%; Test results show that the quantum efficiency of the black silicon photodetector reaches 80.7% and its response rate reaches 0.69 A/W at 1 060 nm, which is 116% higher than that of the nonintegrated black silicon devices.
41120 黑硅探测器暗电流小于8nA，响应时间小于8ns，电容小于9pF，与未集成黑硅的器件相当。 The dark current of the black silicon detector is less than 8 nA, the response time is less than 8 ns, and the capacitance is less than 9 pF, which is equivalent to that of the non-integrated black silicon devices.
41121 得益于工艺兼容性，所采用的黑硅技术具有广泛应用于硅基近红外PIN，APD，SPAD，SPM等光电探测器的潜力，可显著提高器件的响应率、量子效率、响应速度、击穿电压温度系数等性能。 Due to the process compatibility, the black silicon technology has the potential to be widely used in silicon-based near-infrared PIN, APD, SPAD, SPM and other photodetectors, so as to significantly improve the response rate, quantum efficiency, response speed, temperature coefficient of breakdown voltage and other performance.
41122 针对飞行时间法(TOF)获取点云的相关特点，提出一种适用于TOF点云的改进配准算法， According to the relevant characteristics of point cloud acquisition of time-offlight method(TOF), an improved registration algorithm suitable for TOF point cloud was proposed.
41123 首先使用FPFH特征对点云进行粗配准; Firstly, FPFH features were used to perform rough registration of point cloud.
41124 在精配准阶段，通过法向量夹角特征采样的方法来减少点云的点数， And in the fine registration stage, the angle feature sampling method of normal vector was used to reduce the number of points of the point cloud, while retaining the key information points of the point cloud.
41125 同时又保留点云的关键信息点，并引入KD树和RANSAC方法来改进ICP的配准效率。 At the same time, KD tree and RANSAC method were introduced to improve the registration efficiency of ICP.