ID 原文 译文
40866 基于0.13μm工艺进行设计，仿真结果表明:在3.3 V电源电压及温度从-100℃到140℃的情况下，带隙基准电压的温漂系数为1.68 ppm/℃，电源电压抑制比为90.4 dB。 Based on 0.13 μm process, thereference circuitisdesignedandthe simulation results show that the temperature drift coefficient of the band-gap reference voltage is 1.68 ppm/oC and the PSRR is 90.4 dB under the condition of 3.3 V supply voltage and temperature from-100℃ to 140 ℃.
40867 为提高标准单元在空间辐射条件下抗单粒子闩锁能力，基于65 nm CMOS工艺使用TCAD工具建立了4种保护环结构的3D模型。 Aiming to improve the single event latch-up(SEL) performance of CMOS stand cell in 65-nm process, 3 D models of four guard ring had been built up by using Technology Computer Aided Design(TCAD) tool.
40868 设计对比了多种抗单粒子闩锁加固方法，对抗辐照性能和设计开销进行了优化。 Several different structures had been compared with TCAD simulation to compromise the anti-SEL performance and design costs.
40869 仿真结果显示，使用半封闭型保护环结构可在满足抗辐照要求的情况下最小化设计开销，同时通过模拟辐照仿真对该结构的关键设计参数进行了优化。 The simulation results showed that the unclosed guard ring structures was the best choice for stand cell of 65-nm, and the key design parameters of the structure are optimized by simulating irradiation simulation.
40870 基于提出的版图加固设计标准单元开发了测试芯片并完成了重粒子试验，经过99.8 MeV*cm~2/mg重离子辐照未观察到闩锁现象。 A test chip using proposed radiation harden library had been tested in heavy ion experiment and no SEL occurred up to a LET of 99.8 MeV/mg/cm
40871 数字电路的亚稳态现象会导致数据发生误码，同步寄存器链常常被用于降低亚稳态发生的概率。 Metastability of digital circuits can lead to data error.Synchronous register chains are often used to reduce the probability of metastability.
40872 为了量化由亚稳态导致的数据误码发生概率，本文从亚稳态产生的本质出发分析了亚稳态在同步寄存器链中传递的原因; In order to quantify the probability of data error caused by metastable state, this paper analyzes the reason of metastable transfer in synchronous register chain according to the essence of metastable state.
40873 推导了考虑线延迟与逻辑门延迟影响的精确亚稳态稳定时间公式; The precise formula of metastable stability time considering the effect of linear delay and logic gate delay is derived.
40874 设计了一种新亚稳态测试电路计算三种亚稳态输出结果发生的概率。 A new metastable test circuit is designed to calculate the probability of occurrence of three metastable output results.
40875 在平均故障时间参数的基础上，计算了因为亚稳态而造成的同步寄存器链误码率和整个系统的误码率，给出了降低系统误码率的措施。 Based on the mean time to failure(MTBF), the bit error rate(BER) of synchronization chain and the whole system due to metastability are calculated, and the measures to reduce the BER of the system are given.