ID 原文 译文
40566 然而5G USIM卡中的加密算法依旧受到侧信道分析技术的威胁. However, the encryption algorithms in 5 G USIM card are still threatened by the side channel attack.
40567 文章研究了5G AKA鉴权协议的流程和架构，分析了该协议在密钥生成阶段的脆弱性， The process and architecture of 5 G AKA authentication protocol are studied, and the vulnerability of the protocol in the key generation phase is analyzed.
40568 针对商用5G USIM卡实施了相关性功耗分析，恢复出秘密参数， The correlation power analysis is carried out for commercial 5 G USIM cards, and the secret parameters are recovered.
40569 并据此实现了对5G USIM卡的复制、入网和鉴权测试，验证了其对侧信道分析技术的脆弱性. Based on this, the replication, network entry and authentication tests of 5 G USIM cards are implemented, and the vulnerability of the anti-side channel analysis technology is verified.
40570 SEM IP(Soft Error Mitigation软错误缓解核)是对SRAM FPGA设计进行单粒子故障注入的一种有效方法. SEM(Soft Error Mitigation)IP is an effective method of single event fault injection for SRAM FPGA design.
40571 然而由于目标设计与SEM IP部分随机布局布线在一块芯片上，导致进行故障注入时很有可能会打翻SEM IP所使用的配置寄存器而导致故障注入停止工作，同时对于目标设计失效率统计不准确. However, the target design and the SEM IP part are randomly placed and routed on the same chip, when fault injection is performed, the configuration register used by the SEM IP is likely to be overturned, causing the fault injection system to stop working and the failure rate of the target design is not accurate.
40572 为解决这一问题，基于SEM IP和部分重配置技术开发了一套单粒子故障注入原型系统用于单粒子故障注入实验. To solve this problem, a single event fault injection prototype system based on SEM IP and partial reconfiguration technology is developed for single particle injection.
40573 该方法将SEM IP和目标设计布局布线到芯片的不同区域，能够只对目标设计所在区域进行故障注入并且不中断目标设计运行， The method places and routes the SEM IP and the target design to different areas of the chip, can only perform fault injection into the area where the target design is located without interrupting SEM IP operation itself.
40574 并且在发生不可纠正错误后对目标设计所在区域进行部分重新配置， Besides, the area of the target design can be reconfigured when an uncorrectable error occurs.
40575 配置数据更少，用时更短，系统故障的注入效率大大提高，提高对于目标设计软错误失效率估计的准确性. The method needs less configuration data and shorter time, which greatly improves the efficiency of fault injection experiment and the accuracy of the target design soft failure rate estimation.