ID 原文 译文
16095 在预定的工作波段范围内得到了近似平直的光谱面，实现单次接收信号光束的多波长同步测量，工作波段覆盖340 nm～800 nm，光谱带宽优于8 nm。 The working band covered 340 nm～800 nm,and the spectral bandwidth was better than 8 nm.
16096 以能够在紫外波段产生局域表面等离激元共振的Al纳米颗粒作为研究对象，利用时域有限差分法(FDTD)对立方柱形Al纳米结构的近场局域增强和远场特性进行了模拟与分析。 Al nanoparticles which could produce localized surface plasmon resonance in ultraviolet band were taken as the object of research. The near-field local enhancement and far-field properties of square cylindrical Al nanostructures were simulated and analyzed by using the method of finite-difference time-domain(FDTD).
16097 首先对不同尺寸的立方柱形Al纳米颗粒的远场消光特性进行分析； Firstly,the far-field extinction characteristics of cubic cylindrical Al nanoparticles with different sizes were analyzed.
16098 结果表明，增大纳米颗粒尺寸，共振峰红移，并且局域表面等离激元共振峰呈现出一定的展宽，其消光系数先增大后减小。 The results showed that with the increase of the particle size,the resonance peak was red-shifted,and the localized surface plasmon resonance peak was broadened to a certain extent,and the extinction coefficient increased at first and then decreased.
16099 其次分析了在局域表面等离激元共振波长下的近场增强特性； And then,the near-field enhancement characteristics of the localized surface plasmon resonance wavelength were analyzed.
16100 结果表明，金属纳米颗粒对该共振波长下的电场增强效果显著。 The results showed that the metal nanoparticles had a significant effect on the electric field enhancement at the resonance wavelength.
16101 从研究中发现，Al纳米结构的尺寸会对其LSPR效果产生显著影响，可以通过改变尺寸参数来调控纳米结构的LSPR特性，实现紫外波段的局域表面等离激元的共振激发。 From the study,it is found that the size of Al nanostructures has a significant effect on its LSPR effect. The LSPR characteristics of nanostructures could be adjusted by changing the size parameters,and the resonance excitation of localized surface plasmon in ultraviolet band could be realized.
16102 采用射频磁控溅射设备以NiO为空穴注入层在MQWs/n-GaN上制备了p-NiO/MQWs/n-GaN异质结发光器件。 The light-emitting diodes(LEDs)was fabricated,which consisted of p-NiO/MQWs/n-GaN heterostructure with NiO as a hole injection layer on MQWs/n-GaN by using Rf magnetron sputtering equipment.
16103 通过X射线衍射仪(XRD)、原子力显微镜(AFM)、紫外分光光度计(UV-2700)等测试系统对制备的NiO层结构、形貌及光学特性进行了测试，结果表明NiO薄膜具有较好的结晶质量。 The structure,morphology and optical properties of the NiO layer were tested by X-ray diffraction(XRD),Atomic Force Microscope(AFM)and Ultraviolet Spectrophotometer(UV-2700),and the results showed that the NiO film had good crystalline quality.
16104 对p-NiO/MQWs/n-GaN异质结器件进行了电流-电压(I-V)特性和电致发光(EL)特性测试。 The Current-Voltage(I-V)and electroluminescent(EL)characteristics of p-NiO/MQWs/n-GaN heterojunction devices were tested.